Studying Nanoferroics with Piezoresponse Force Microscopy

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Studying Nanoferroics with Piezoresponse Force Microscopy
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Piezoresponse Force Microscopy is pivotal in nanoferroics, mapping ferroic domains with high resolution for advanced material design and device fabrication.

By Rebecca Ingle, Ph.DFeb 23 2024Reviewed by Megan Craig, M.Sc. Nanoferroics are nanoscale materials with ferroic properties, meaning they are materials that undergo a reversible change to their physical properties in the presence of an external field. There can be a number of different mechanisms that cause a material to exhibit ferroic behavior.

Related StoriesA standard AFM measurement will use an atomically sharp tip to scan over the material's surface. However, there are different types of AFM scanning modes, as the amount of force exerted by the material on the tip changes, a change in current can be measured and quantified. As the 3D position of the tip is known very precisely, the variation in the measured current across the surface can be reconstructed to make the AFM image.

For nanoferroic research, investigation of the domain structure of materials is critical as the overall shape, size and behavior of domains influence the final material properties. Ferroic materials have localized regions where the electric dipoles, magnetic moments, or crystal lattices are arranged in a particular direction.

Many new classes of material in nanoferroic research are now trying to exploit ultrathin layers and heterostructures, which PFM is well-suited to measuring as well as capturing the effects of local defects, which require the high spatial resolution to image directly.

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