The Asylum Research Jupiter XR Atomic Force Microscope from Oxford Instruments is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.
Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.
Extended-range scanner is 5-20× faster than most AFMs and features large 100 µm X-Y & 12 µm Z rangeSimpler User ExperienceFully-addressable, high-speed stage rapidly reaches any point on 200 mm samplesGo from atoms to large 100-µm scans and use any imaging mode, all with the single XR scannerModular design makes it fast and simple to add accessories and future upgradesJupiter XR large-sample AFM + easy to operate Ergo...
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